Towards 3D crystal orientation reconstruction using automated crystal orientation mapping transmission electron microscopy (ACOM-TEM)

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Towards 3D crystal orientation reconstruction using automated crystal orientation mapping transmission electron microscopy (ACOM-TEM)

To relate the internal structure of a volume (crystallite and phase boundaries) to properties (electrical, magnetic, mechanical, thermal), a full 3D reconstruction in combination with in situ testing is desirable. In situ testing allows the crystallographic changes in a material to be followed by tracking and comparing the individual crystals and phases. Standard transmission electron microscop...

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Channeling in helium ion microscopy: Mapping of crystal orientation

BACKGROUND The unique surface sensitivity and the high resolution that can be achieved with helium ion microscopy make it a competitive technique for modern materials characterization. As in other techniques that make use of a charged particle beam, channeling through the crystal structure of the bulk of the material can occur. RESULTS Here, we demonstrate how this bulk phenomenon affects sec...

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Grain rotations in ultrafine-grained aluminum films studied using in situ TEM straining with automated crystal orientation mapping

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Transmission electron backscattered diffraction, t-EBSD, in the scanning electron microscope, SEM, was initially described in 2010 [1]. After slow initial acceptance, the number of publications in which it is used is increasing markedly. Many of the first applications took advantage of the higher resolution of t-EBSD in the study of thin films [2], [3]. More recently it is being used for pre-sc...

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ژورنال

عنوان ژورنال: Beilstein Journal of Nanotechnology

سال: 2018

ISSN: 2190-4286

DOI: 10.3762/bjnano.9.56